Following up on our previous piece on contrast methods, in Part II we talk about Polarization and DIC.
Polarization - This contrast method is especially helpful in reducing glare from Metals, Integrated Chips and PCB solder. You can rotate polarizer filters with respect to each other in order to control the right amount of lighting while reducing glare in samples that have birefringence or multiple colors with shiny parts. Polarization is available in both of Motic’s Panthera TEC and PA53 MET upright compound microscope models.
DIC - DIC stands for Differential Interference Contrast. This contrast method separates out features by color and elevates them in order to have a better viewing experience for your inspection needs. A DIC prism can also be rotated to change colors on your samples so that you can view borders and edges with enhanced visual comfort. This contrast method is especially helpful on Semiconductor wafers, or metallic surfaces with small height differences you need to capture.
Motic offers DIC on its PA53 MET upright compound microscope.
Brightfield, Darkfield, polarization and DIC are extremely useful tools for optical analysis and depending on the application, can be a vital part of your examination process.
If you are interested in obtaining imaging on your samples using any or all of the above techniques, click on the link below for an Imaging Appointment.
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